LOW ENERGY SPUTTERING OF TANTALUM THIN-FILM MICROCIRCUITS

被引:0
作者
BEYNON, J
机构
来源
ELECTRONIC ENGINEERING | 1968年 / 40卷 / 488期
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:547 / &
相关论文
共 50 条
[41]   TANTALUM-GLASS CERMET THIN-FILM RESISTORS [J].
UMEZAWA, T ;
YAJIMA, S .
ELECTRONICS & COMMUNICATIONS IN JAPAN, 1973, 55 (01) :96-102
[42]   Tantalum Thin-Film Superconducting Transition Edge Thermometers [J].
Masoud Mohazzab ;
Norbert Mulders ;
Al Nash ;
Melora Larson .
Journal of Low Temperature Physics, 2000, 121 :821-824
[43]   Evaluation of residual stress in sputtered tantalum thin-film [J].
Al-masha'al, Asa'ad ;
Bunting, Andrew ;
Cheung, Rebecca .
APPLIED SURFACE SCIENCE, 2016, 371 :571-575
[44]   TANTALUM THIN-FILM CAPACITORS WITH VARIOUS TYPES OF COUNTERELECTRODES [J].
FERRARIS, GP ;
MAY, R .
ELECTROCOMPONENT SCIENCE AND TECHNOLOGY, 1980, 6 (3-4) :235-240
[45]   TANTALUM THIN-FILM APPLICATIONS - NEW APPROACH FOR CAPACITORS [J].
PERINATI, A .
ELECTROCOMPONENT SCIENCE AND TECHNOLOGY, 1977, 4 (02) :69-73
[46]   Low Temperature Organic Thin-Film Transistor Based on Tantalum Pentoxide Prepared by Anodization [J].
Lan, L. F. ;
Xu, M. ;
Zou, J. H. ;
Tao, H. ;
Wang, L. ;
Li, M. ;
Xu, H. ;
Luo, D. X. ;
Yu, S. F. ;
Bai, S. H. ;
Wang, C. F. ;
Xu, R. X. ;
Peng, J. B. .
PROCEEDINGS OF CHINA DISPLAY/ASIA DISPLAY 2011, 2011, :528-529
[47]   SUPERCONDUCTING THIN-FILM LOW-ENERGY PARTICLE DETECTOR [J].
HOYLE, JA ;
HUMPHRIS, RR ;
BORING, JW .
IEEE TRANSACTIONS ON MAGNETICS, 1975, MA11 (02) :690-693
[48]   CRYSTALLOGRAPHIC CHARACTER OF ZNO THIN-FILM FORMED AT LOW SPUTTERING GAS-PRESSURE [J].
MIURA, M .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1982, 21 (02) :264-271
[49]   FABRICATION OF THIN-FILM VARISTORS USING SPUTTERING TECHNIQUE [J].
YANO, Y ;
MOROOKA, H .
NIPPON SERAMIKKUSU KYOKAI GAKUJUTSU RONBUNSHI-JOURNAL OF THE CERAMIC SOCIETY OF JAPAN, 1994, 102 (03) :305-308
[50]   THIN-FILM SPUTTERING IMPROVED BY HANDLING DISKS INDIVIDUALLY [J].
LAVINE, RE .
RESEARCH & DEVELOPMENT, 1985, 27 (03) :111-&