ANALYSIS OF SCHLIERENGRAMS IN REFRACTOMETRY OF AXISYMMETRIC OBJECTS

被引：1

|

作者：

UGNIEWSKI, S

机构：

来源：

APPLIED OPTICS | 1980年 / 19卷 / 20期

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D O I：

10.1364/AO.19.003421

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

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页码：3421 / 3422

页数：2

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