MACROMODEL PREDICTIONS FOR EMI IN BIPOLAR OPERATIONAL-AMPLIFIERS

被引:18
作者
CHEN, GKC [1 ]
WHALEN, JJ [1 ]
机构
[1] SUNY BUFFALO,DEPT ELECT ENGN,AMHERST,NY 14226
关键词
D O I
10.1109/TEMC.1980.303864
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:262 / 265
页数:4
相关论文
共 6 条
[1]   MACROMODELING OF INTEGRATED-CIRCUIT OPERATIONAL AMPLIFIERS [J].
BOYLE, GR ;
COHN, BM ;
PEDERSON, DO ;
SOLOMON, JE .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1974, SC 9 (06) :353-364
[2]   USING NCAP TO PREDICT RFI EFFECTS IN LINEAR BIPOLAR INTEGRATED-CIRCUITS [J].
FANG, TF ;
WHALEN, JJ ;
CHEN, GKC .
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, 1980, 22 (04) :256-262
[3]  
FANG TF, 1979, THESIS STATE U NEW Y
[4]  
FANG TF, 1980, RADCTR79324 TECH REP
[5]   COMPUTER-AIDED ANALYSIS OF RFI EFFECTS IN OPERATIONAL-AMPLIFIERS [J].
TRONT, JG ;
WHALEN, JJ ;
LARSON, CE ;
ROE, JM .
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, 1979, 21 (04) :297-306
[6]  
WEINER DD, 1980, ISBN0442260938