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MACROMODEL PREDICTIONS FOR EMI IN BIPOLAR OPERATIONAL-AMPLIFIERS
被引:18
作者
:
CHEN, GKC
论文数:
0
引用数:
0
h-index:
0
机构:
SUNY BUFFALO,DEPT ELECT ENGN,AMHERST,NY 14226
SUNY BUFFALO,DEPT ELECT ENGN,AMHERST,NY 14226
CHEN, GKC
[
1
]
WHALEN, JJ
论文数:
0
引用数:
0
h-index:
0
机构:
SUNY BUFFALO,DEPT ELECT ENGN,AMHERST,NY 14226
SUNY BUFFALO,DEPT ELECT ENGN,AMHERST,NY 14226
WHALEN, JJ
[
1
]
机构
:
[1]
SUNY BUFFALO,DEPT ELECT ENGN,AMHERST,NY 14226
来源
:
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY
|
1980年
/ 22卷
/ 04期
关键词
:
D O I
:
10.1109/TEMC.1980.303864
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:262 / 265
页数:4
相关论文
共 6 条
[1]
MACROMODELING OF INTEGRATED-CIRCUIT OPERATIONAL AMPLIFIERS
BOYLE, GR
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV CALIF,DEPT ELECT ENGN & COMP SCI,BERKELEY,CA 94720
BOYLE, GR
COHN, BM
论文数:
0
引用数:
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h-index:
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机构:
UNIV CALIF,DEPT ELECT ENGN & COMP SCI,BERKELEY,CA 94720
COHN, BM
PEDERSON, DO
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引用数:
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h-index:
0
机构:
UNIV CALIF,DEPT ELECT ENGN & COMP SCI,BERKELEY,CA 94720
PEDERSON, DO
SOLOMON, JE
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV CALIF,DEPT ELECT ENGN & COMP SCI,BERKELEY,CA 94720
SOLOMON, JE
[J].
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
1974,
SC 9
(06)
: 353
-
364
[2]
USING NCAP TO PREDICT RFI EFFECTS IN LINEAR BIPOLAR INTEGRATED-CIRCUITS
FANG, TF
论文数:
0
引用数:
0
h-index:
0
机构:
SUNY BUFFALO,DEPT ELECT ENGN,BUFFALO,NY 14226
SUNY BUFFALO,DEPT ELECT ENGN,BUFFALO,NY 14226
FANG, TF
WHALEN, JJ
论文数:
0
引用数:
0
h-index:
0
机构:
SUNY BUFFALO,DEPT ELECT ENGN,BUFFALO,NY 14226
SUNY BUFFALO,DEPT ELECT ENGN,BUFFALO,NY 14226
WHALEN, JJ
CHEN, GKC
论文数:
0
引用数:
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h-index:
0
机构:
SUNY BUFFALO,DEPT ELECT ENGN,BUFFALO,NY 14226
SUNY BUFFALO,DEPT ELECT ENGN,BUFFALO,NY 14226
CHEN, GKC
[J].
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY,
1980,
22
(04)
: 256
-
262
[3]
FANG TF, 1979, THESIS STATE U NEW Y
[4]
FANG TF, 1980, RADCTR79324 TECH REP
[5]
COMPUTER-AIDED ANALYSIS OF RFI EFFECTS IN OPERATIONAL-AMPLIFIERS
TRONT, JG
论文数:
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机构:
SUNY BUFFALO,DEPT ELECT ENGN,BUFFALO,NY 14226
TRONT, JG
WHALEN, JJ
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h-index:
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机构:
SUNY BUFFALO,DEPT ELECT ENGN,BUFFALO,NY 14226
WHALEN, JJ
LARSON, CE
论文数:
0
引用数:
0
h-index:
0
机构:
SUNY BUFFALO,DEPT ELECT ENGN,BUFFALO,NY 14226
LARSON, CE
ROE, JM
论文数:
0
引用数:
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h-index:
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机构:
SUNY BUFFALO,DEPT ELECT ENGN,BUFFALO,NY 14226
ROE, JM
[J].
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY,
1979,
21
(04)
: 297
-
306
[6]
WEINER DD, 1980, ISBN0442260938
←
1
→
共 6 条
[1]
MACROMODELING OF INTEGRATED-CIRCUIT OPERATIONAL AMPLIFIERS
BOYLE, GR
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV CALIF,DEPT ELECT ENGN & COMP SCI,BERKELEY,CA 94720
BOYLE, GR
COHN, BM
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV CALIF,DEPT ELECT ENGN & COMP SCI,BERKELEY,CA 94720
COHN, BM
PEDERSON, DO
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV CALIF,DEPT ELECT ENGN & COMP SCI,BERKELEY,CA 94720
PEDERSON, DO
SOLOMON, JE
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV CALIF,DEPT ELECT ENGN & COMP SCI,BERKELEY,CA 94720
SOLOMON, JE
[J].
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
1974,
SC 9
(06)
: 353
-
364
[2]
USING NCAP TO PREDICT RFI EFFECTS IN LINEAR BIPOLAR INTEGRATED-CIRCUITS
FANG, TF
论文数:
0
引用数:
0
h-index:
0
机构:
SUNY BUFFALO,DEPT ELECT ENGN,BUFFALO,NY 14226
SUNY BUFFALO,DEPT ELECT ENGN,BUFFALO,NY 14226
FANG, TF
WHALEN, JJ
论文数:
0
引用数:
0
h-index:
0
机构:
SUNY BUFFALO,DEPT ELECT ENGN,BUFFALO,NY 14226
SUNY BUFFALO,DEPT ELECT ENGN,BUFFALO,NY 14226
WHALEN, JJ
CHEN, GKC
论文数:
0
引用数:
0
h-index:
0
机构:
SUNY BUFFALO,DEPT ELECT ENGN,BUFFALO,NY 14226
SUNY BUFFALO,DEPT ELECT ENGN,BUFFALO,NY 14226
CHEN, GKC
[J].
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY,
1980,
22
(04)
: 256
-
262
[3]
FANG TF, 1979, THESIS STATE U NEW Y
[4]
FANG TF, 1980, RADCTR79324 TECH REP
[5]
COMPUTER-AIDED ANALYSIS OF RFI EFFECTS IN OPERATIONAL-AMPLIFIERS
TRONT, JG
论文数:
0
引用数:
0
h-index:
0
机构:
SUNY BUFFALO,DEPT ELECT ENGN,BUFFALO,NY 14226
TRONT, JG
WHALEN, JJ
论文数:
0
引用数:
0
h-index:
0
机构:
SUNY BUFFALO,DEPT ELECT ENGN,BUFFALO,NY 14226
WHALEN, JJ
LARSON, CE
论文数:
0
引用数:
0
h-index:
0
机构:
SUNY BUFFALO,DEPT ELECT ENGN,BUFFALO,NY 14226
LARSON, CE
ROE, JM
论文数:
0
引用数:
0
h-index:
0
机构:
SUNY BUFFALO,DEPT ELECT ENGN,BUFFALO,NY 14226
ROE, JM
[J].
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY,
1979,
21
(04)
: 297
-
306
[6]
WEINER DD, 1980, ISBN0442260938
←
1
→