OPTIMIZATION OF LENS CURRENT OF SCANNING ELECTRON-MICROSCOPE FOR IMAGING AND MICROANALYSIS

被引：0

作者：

DUDEK, HJ ^{[1
]}

BORATH, R ^{[1
]}

机构：

[1] DEUTSCH FORSCH & VERSUCHANSTALT LUFT & RAUMFAHRT, INST WERKSTOFF FORSCH, D-5000 Cologne 90, GERMANY

来源：

MIKROSKOPIE | 1978年 / 34卷 / 5-6期

关键词：

D O I：

暂无

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：191 / 191

页数：1

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