OPTIMIZATION OF LENS CURRENT OF SCANNING ELECTRON-MICROSCOPE FOR IMAGING AND MICROANALYSIS

被引：0
|
作者：
DUDEK, HJ [1 ]
BORATH, R [1 ]
机构：
[1] DEUTSCH FORSCH & VERSUCHANSTALT LUFT & RAUMFAHRT, INST WERKSTOFF FORSCH, D-5000 Cologne 90, GERMANY
来源：
MIKROSKOPIE | 1978年 / 34卷 / 5-6期
关键词：
D O I：
暂无
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
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页码：191 / 191
页数：1
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