OPTIMIZATION OF LENS CURRENT OF SCANNING ELECTRON-MICROSCOPE FOR IMAGING AND MICROANALYSIS

被引：0

作者：

DUDEK, HJ ^{[1
]}

BORATH, R ^{[1
]}

机构：

[1] DEUTSCH FORSCH & VERSUCHANSTALT LUFT & RAUMFAHRT, INST WERKSTOFF FORSCH, D-5000 Cologne 90, GERMANY

来源：

MIKROSKOPIE | 1978年 / 34卷 / 5-6期

关键词：

D O I：

暂无

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：191 / 191

页数：1

共 50 条

[11] SCANNING ELECTRON-MICROSCOPE ATTACHMENT FOR ELECTRON-MICROSCOPE
MIYAUCHI, K
WATANABE, T
KUBOZOE, M
JOURNAL OF ELECTRON MICROSCOPY, 1972, 21 (03): : 256 - 256
[12] MICROANALYSIS IN THE TRANSMISSION ELECTRON-MICROSCOPE
GOODHEW, PJ
CHESCOE, D
MICRON, 1980, 11 (02) : 153 - 181
[13] MEASUREMENT OF ASPHERICAL FORM OF LENS BY SCANNING ELECTRON-MICROSCOPE
KOKAWA, R
SATO, H
OHORI, M
JSME INTERNATIONAL JOURNAL SERIES III-VIBRATION CONTROL ENGINEERING ENGINEERING FOR INDUSTRY, 1992, 35 (02): : 294 - 300
[14] SCANNING ELECTRON-MICROSCOPE WITH A SINGLE-POLEPIECE LENS
KOLARIK, V
MULLEROVA, I
LENC, M
SCANNING MICROSCOPY, 1989, 3 (04) : 1003 - 1008
[15] IMAGING WITH BACKSCATTERED ELECTRONS IN A SCANNING ELECTRON-MICROSCOPE
ROBINSON, VNE
SCANNING, 1980, 3 (01) : 15 - 26
[16] ENHANCED TOPOGRAPHY IMAGING IN THE SCANNING ELECTRON-MICROSCOPE
GRIFFIN, NS
MEASUREMENT SCIENCE AND TECHNOLOGY, 1994, 5 (11) : 1403 - 1406
[17] X-RAY MICROANALYSIS OF PRECIPITATES, USING A SCANNING ELECTRON-MICROSCOPE
MATHY, H
GREADY, T
JOURNAL DE MICROSCOPIE, 1974, 19 (03): : A5 - A6
[18] REFLECTION ELECTRON-MICROSCOPE IMAGING OF AN OPERATING SCANNING TUNNELING MICROSCOPE
KUWABARA, M
LO, W
SPENCE, JCH
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (04): : 2745 - 2751
[19] METALLURGICAL APPLICATIONS OF X-RAY MICROANALYSIS IN SCANNING ELECTRON-MICROSCOPE
DROST, N
ZEEDIJK, HB
JOURNAL DE MICROSCOPIE, 1974, 19 (03): : A3 - A3
[20] RECORDING TRANSMITTED BEAM CURRENT FOR X-RAY-MICROANALYSIS IN A SCANNING-TRANSMISSION ELECTRON-MICROSCOPE
MARSHALL, AT
JOURNAL OF MICROSCOPY-OXFORD, 1980, 120 (NOV): : 207 - 211

← 1 2 3 4 5 →