DEPTH DEPENDENCE FOR EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE SPECTROSCOPY DETECTED VIA ELECTRON YIELD IN HE AND IN VACUUM

被引：132
作者：
ELAM, WT
KIRKLAND, JP
NEISER, RA
WOLF, PD
机构：
来源：
PHYSICAL REVIEW B | 1988年 / 38卷 / 01期
关键词：
D O I：
10.1103/PhysRevB.38.26
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
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页码：26 / 30
页数：5
相关论文
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