RAISING YIELD AND THROUGHPUT IN FRONT-END WAFER PROCESSING

被引:0
|
作者
LOVELESS, WL [1 ]
机构
[1] GCA,SUNNYVALE DIV,SUNNYVALE,CA
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:47 / 50
页数:4
相关论文
共 50 条
  • [21] An investigation into front-end signal processing for speaker normalization
    Umesh, S
    Sinha, R
    Kumar, SVB
    2004 IEEE INTERNATIONAL CONFERENCE ON ACOUSTICS, SPEECH, AND SIGNAL PROCESSING, VOL I, PROCEEDINGS: SPEECH PROCESSING, 2004, : 345 - 348
  • [22] Impact of copper contacts on CMOS front-end yield and reliability
    Van den Bosch, G.
    Demuynck, S.
    Tokei, Zs.
    Beyer, G.
    Van Hove, M.
    Groeseneken, G.
    2006 INTERNATIONAL ELECTRON DEVICES MEETING, VOLS 1 AND 2, 2006, : 780 - +
  • [23] TXRF applications supporting yield enhancements and tool monitoring in order to improve the front-end semiconductor processing
    Budd, Thanas
    2008 IEEE/SEMI ADVANCED SEMICONDUCTOR MANUFACTURING CONFERENCE, 2008, : 292 - 296
  • [24] Impact of wafer thinning on front-end reliability for 3D integration
    Chasin, Adrian
    Scholz, Mirko
    Guo, Wei
    Franco, Jacopo
    Potoms, Goedele
    Jourdain, Anne
    Linten, Dimitri
    Van der Plas, Geert
    Absil, Philippe
    Beyne, Eric
    2016 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2016,
  • [25] ASIC wafer test system for the ATLAS semiconductor tracker front-end chip
    Anghinolfi, F
    Bialas, W
    Busek, N
    Ciocio, A
    Cosgrove, D
    Fadeyev, V
    Flacco, C
    Gilchriese, M
    Grillo, AA
    Haber, C
    Kaplon, J
    Lacasta, C
    Murray, W
    Niggli, H
    Pritchard, T
    Rosenbaum, F
    Spieler, H
    Stezelberger, T
    Vu, C
    Wilder, M
    Yaver, H
    Zetti, F
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2002, 49 (03) : 1080 - 1085
  • [26] ASIC wafer test system for the ATLAS Semiconductor Tracker front-end chip
    Anghinolfi, F
    Bialas, W
    Busek, N
    Ciocio, A
    Cosgrove, D
    Fadeyev, V
    Flacco, C
    Gilchriese, M
    Grillo, AA
    Haber, C
    Kaplon, J
    Lacasta, C
    Murray, W
    Niggli, H
    Pritchard, T
    Rosenbaum, F
    Spieler, H
    Stezelberger, T
    Vu, C
    Wilder, M
    Yaver, H
    Zetti, F
    2001 IEEE NUCLEAR SCIENCE SYMPOSIUM, CONFERENCE RECORDS, VOLS 1-4, 2002, : 650 - 654
  • [27] Which Spare Parts Service Measure to Choose for a Front-End Wafer Fab?
    Lamghari-Idrissi, Douniel
    Basten, Rob
    Dellaert, Nico
    van Houtum, Geert-Jan
    IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, 2020, 33 (04) : 504 - 510
  • [28] FRONT-END PROCESSORS
    STIEFEL, ML
    MINI-MICRO SYSTEMS, 1977, 10 (10): : 58 - &
  • [29] Front-end thinkers
    Carreira Zafra, Cintia
    BORDON-REVISTA DE PEDAGOGIA, 2020, 72 (03): : 176 - 178
  • [30] FRONT-END ALIGNMENT
    FELDMAN, L
    AUDIO, 1969, 53 (05): : 30 - &