CONTRAST SIMULATION OF HIGH-RESOLUTION ELECTRON HOLOGRAPHY ON SURFACE-STRUCTURES

被引：1

作者：

TANJI, T ^{[1
]}

ITO, J ^{[1
]}

YADA, K ^{[1
]}

机构：

[1] TOHOKU UNIV,SCI MEASUREMENTS RES INST,SENDAI,MIYAGI 980,JAPAN

来源：

ULTRAMICROSCOPY | 1991年 / 35卷 / 3-4期

关键词：

D O I：

10.1016/0304-3991(91)90076-I

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

The advantage of electron holography in the study of the atomic structure of crystal surfaces with high spatial resolution is revealed by using a computer simulation in the case of the 7 x 7 superstructure on a clean Si(111) surface. The surface structure can be reconstructed from the hologram which also reproduces the 1 x 1 primary bulk structure with the same coordinates. A new algorithm for image restoration is applied successfully to this reconstructed image. The effect of aberrations of a transmission electron microscope instrument is eliminated and the typical structure of the surface is represented.

引用

页码：245 / 253

页数：9

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