CONTRAST SIMULATION OF HIGH-RESOLUTION ELECTRON HOLOGRAPHY ON SURFACE-STRUCTURES

被引：1
|
作者：
TANJI, T [1 ]
ITO, J [1 ]
YADA, K [1 ]
机构：
[1] TOHOKU UNIV,SCI MEASUREMENTS RES INST,SENDAI,MIYAGI 980,JAPAN
来源：
ULTRAMICROSCOPY | 1991年 / 35卷 / 3-4期
关键词：
D O I：
10.1016/0304-3991(91)90076-I
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
The advantage of electron holography in the study of the atomic structure of crystal surfaces with high spatial resolution is revealed by using a computer simulation in the case of the 7 x 7 superstructure on a clean Si(111) surface. The surface structure can be reconstructed from the hologram which also reproduces the 1 x 1 primary bulk structure with the same coordinates. A new algorithm for image restoration is applied successfully to this reconstructed image. The effect of aberrations of a transmission electron microscope instrument is eliminated and the typical structure of the surface is represented.
引用
收藏
页码：245 / 253
页数：9
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