ELECTRON-MICROSCOPY OF INTERFACES BETWEEN TRANSFORMING POLYTYPES IN SILICON-CARBIDE

被引：29

作者：

JEPPS, NW

PAGE, TF

机构：

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1979年 / 116卷 / MAY期

关键词：

D O I：

10.1111/j.1365-2818.1979.tb00199.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：159 / 171

页数：13

共 50 条

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