EASILY TESTABLE VLSI-CIRCUITS - DESIGN AND TEST PRINCIPLES

[1] ADVANCED FAULT ISOLATION SYSTEM FOR DIGITAL LOGIC [J]. IEEE TRANSACTIONS ON COMPUTERS, 1975, C 24 (05) : 489 - 497

[2] BOTTORFF PS, 1977, 14TH P DES AUT C, P479

[3] BOTTORFF PS, 1979, 1979 P INT SOL STAT, P252

[4] CARTER W, 1964, IBM J APR, P115

[5] CRONZET Y, 1978, 4TH P EUR SOL STAT C, P173

[6] EICHELBERGER EB, 1977, 14TH P DES AUT C, P462

[7] TEST ROUTINES BASED ON SYMBOLIC LOGICAL STATEMENTS [J]. JOURNAL OF THE ACM, 1959, 6 (01) : 33 - 36

[8] FANATSU S, 1978, 1978 P SEM TEST C CH, P98

[9] EASILY TESTABLE SEQUENTIAL-MACHINES WITH EXTRA INPUTS [J]. IEEE TRANSACTIONS ON COMPUTERS, 1975, 24 (08) : 821 - 826

[10] IMPROVED BOUND ON LENGTH OF CHECKING EXPERIMENTS FOR SEQUENTIAL MACHINES WITH COUNTER CYCLES [J]. IEEE TRANSACTIONS ON COMPUTERS, 1972, C 21 (06) : 597 - &

[1] ADVANCED FAULT ISOLATION SYSTEM FOR DIGITAL LOGIC [J]. IEEE TRANSACTIONS ON COMPUTERS, 1975, C 24 (05) : 489 - 497

[2] BOTTORFF PS, 1977, 14TH P DES AUT C, P479

[3] BOTTORFF PS, 1979, 1979 P INT SOL STAT, P252

[4] CARTER W, 1964, IBM J APR, P115

[5] CRONZET Y, 1978, 4TH P EUR SOL STAT C, P173

[6] EICHELBERGER EB, 1977, 14TH P DES AUT C, P462

[7] TEST ROUTINES BASED ON SYMBOLIC LOGICAL STATEMENTS [J]. JOURNAL OF THE ACM, 1959, 6 (01) : 33 - 36

[8] FANATSU S, 1978, 1978 P SEM TEST C CH, P98

[9] EASILY TESTABLE SEQUENTIAL-MACHINES WITH EXTRA INPUTS [J]. IEEE TRANSACTIONS ON COMPUTERS, 1975, 24 (08) : 821 - 826

[10] IMPROVED BOUND ON LENGTH OF CHECKING EXPERIMENTS FOR SEQUENTIAL MACHINES WITH COUNTER CYCLES [J]. IEEE TRANSACTIONS ON COMPUTERS, 1972, C 21 (06) : 597 - &