MIGRATION OF SMALL ANGLE BOUNDARIES

被引:43
作者
GLEITER, H
机构
[1] Harvard University, Gordon McKay Laboratory, Cambridge, MA
来源
PHILOSOPHICAL MAGAZINE | 1969年 / 20卷 / 166期
关键词
D O I
10.1080/14786436908228047
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
It is shown by transmission electron microscopy that the migration of small angle boundaries occurs by the movement of steps which have a high mobility along the boundaries. A dislocation model for the steps is proposed. According to this model the steps are singularities in the small angle boundary. The steps migrate by short-circuit diffusion of atoms along the core of the dislocation which forms the step. In the parts of the small angle boundary between the steps migrate by volume diffusion. It is shown that coarsening of sub-grains is due to the migration of small angle boundaries. © 1969 Taylor & Francis Group, LLC.
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页码:821 / &
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