INVESTIGATIONS OF FLASH EVAPORATED CUBIIIC2VI SEMICONDUCTOR THIN-FILMS BY RUTHERFORD BACKSCATTERING SPECTROSCOPY

被引：9

作者：

HOBLER, HJ ^{[1
]}

FLAGMEYER, R ^{[1
]}

SCHUMANN, B ^{[1
]}

机构：

[1] KARL MARX UNIV,SEKT PHYS,WISSENSCHAFT BEREICH ANGEW KERNPHYS,DDR-7010 LEIPZIG,GER DEM REP

来源：

CRYSTAL RESEARCH AND TECHNOLOGY | 1983年 / 18卷 / 01期

关键词：

D O I：

10.1002/crat.2170180111

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

页码：61 / 70

页数：10

共 21 条

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[2]

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[3]

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[4]

Geist V., 1975, Kristall und Technik, V10, P1115, DOI 10.1002/crat.19750101104

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TU, CC .

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[7] GROWTH AND PROPERTIES OF SPUTTER-DEPOSITED CUINS2 THIN-FILMS [J].

HWANG, HL ;

CHENG, CL ;

LIU, LM ;

LIU, YC ;

SUN, CY .

THIN SOLID FILMS, 1980, 67 (01) :83-93

[8] SEPARATE ESTIMATE OF CRYSTALLITE ORIENTATIONS AND SCATTERING CENTERS IN POLYCRYSTALS BY BACKSCATTERING TECHNIQUE [J].

ISHIWARA, H ;

FURUKAWA, S .

JOURNAL OF APPLIED PHYSICS, 1976, 47 (04) :1686-1689

[9] CUINS2 THIN-FILMS - PREPARATION AND PROPERTIES [J].

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[10]

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