APPLICATIONS OF ULTRAHIGH RESOLUTION ELECTRON-MICROSCOPY AT 200-KV

被引：0

作者：

HUTCHISON, JL ^{[1
]}

机构：

[1] UNIV OXFORD,DEPT MET & SCI MAT,OXFORD,ENGLAND

来源：

JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES | 1981年 / 6卷 / 05期

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：A19 / A19

页数：1

共 50 条

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[9] TECHNICAL PROBLEMS IN 200-KV 150-KV AND 100-KV ELECTRON-MICROSCOPY OF COMPLEMENTARY REPLICAS OF THE GAP-JUNCTION
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