共 50 条
- [1] FRICTION FORCE MICROSCOPY IN ULTRAHIGH-VACUUM - AN ATOMIC-SCALE STUDY ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1995, 209 : 143 - COLL
- [2] ATOMIC-FORCE MICROSCOPY IN ULTRAHIGH-VACUUM JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1994, 33 (6B): : 3726 - 3734
- [7] ATOMIC-SCALE RESOLUTION ON THE MGO(100) SURFACE BY SCANNING FORCE AND FRICTION MICROSCOPY EUROPHYSICS LETTERS, 1994, 26 (09): : 659 - 663
- [9] A LOW-TEMPERATURE ATOMIC FORCE SCANNING TUNNELING MICROSCOPE FOR ULTRAHIGH-VACUUM JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (02): : 984 - 988
- [10] Observation of silicon surfaces using ultrahigh-vacuum noncontact, atomic force microscopy JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1996, 35 (5B): : L668 - L671