SELF-CHECKING SEQUENTIAL-CIRCUIT DESIGN USING M-OUT-OF-N CODES

被引:0
|
作者
BUSABA, FY
LALA, PK
机构
[1] Department of Electrical Engineering, North Carolina A&T State University, Greensboro
关键词
BUILT-IN SELF-TEST; COMPUTER-AIDED DESIGN; CIRCUIT DESIGN; LARGE-SCALE INTEGRATION;
D O I
10.1049/el:19930005
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A technique for designing sequential circuits which are totally self-checking for single stuck at faults is presented. This technique uses m-out-of-n codes for state assignments and for output encoding. The next stage logic and the output logic arc implemented such that any stuck-at fault will either create a single bit error or unidirectional multibit error at the output. The technique has been applied to MCNC benchmark circuits and the overhead is estimated.
引用
收藏
页码:7 / 9
页数:3
相关论文
共 50 条