SOLDER BALL CONNECT (SBC) ASSEMBLIES UNDER THERMAL LOADING .1. DEFORMATION MEASUREMENT VIA MOIRE INTERFEROMETRY, AND ITS INTERPRETATION

被引:84
作者
GUO, Y
LIM, CK
CHEN, WT
WOYCHIK, CG
机构
[1] IBM Microelectronics Div, Endicott, NY
关键词
D O I
10.1147/rd.375.0635
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Thermal deformations that result from mismatches of coefficients of thermal expansion (CTE) in Solder Ball Connect (SBC) assemblies were investigated. The CTE mismatches of the materials and the components in the package have both macro and micro effects on the strain distributions in the SBC interconnections. The geometry of the SBC joint also has a strong influence on the solder strains in the SBC package. An experimental technique with high sensitivity and resolution, moire interferometry, was used to obtain whole-field displacements. Thermal strains in SBC packages, especially the strain concentrations in the SBC joints, were then determined from the displacement fields. The experimental results played an important role in failure analysis, structural design optimization, and finite element model verification in the IBM SBC program. The results also show that moire interferometry is a very powerful and effective tool in experimental studies of electronic packaging.
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页码:635 / 647
页数:13
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