DEFECT STATES IN A-SI1-XGEX-H STUDIED BY ELECTRON-SPIN RESONANCE

被引:22
作者
FINGER, F
FUHS, W
BECK, G
CARIUS, R
机构
关键词
D O I
10.1016/0022-3093(87)90244-4
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
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页码:1015 / 1018
页数:4
相关论文
共 9 条
[1]   HYDROGEN EVOLUTION FROM A-SI-C-H AND A-SI-GE-H ALLOYS [J].
BEYER, W ;
WAGNER, H ;
FINGER, F .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1985, 77-8 :857-860
[2]   HYPERFINE STUDIES OF DANGLING BONDS IN AMORPHOUS-SILICON [J].
BIEGELSEN, DK ;
STUTZMANN, M .
PHYSICAL REVIEW B, 1986, 33 (05) :3006-3011
[4]   ELECTRON-SPIN-RESONANCE (ELECTRON-SPIN-RESONANCE AND LESR) STUDIES IN A-SI1-XGEX-H [J].
FINGER, F ;
CARIUS, R ;
FUHS, W ;
SCHRIMPF, A .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1985, 77-8 :731-734
[5]   A SIMPLE MOLECULAR-ORBITAL CALCULATION OF ELECTRON-SPIN-RESONANCE G-VALUES FOR AMORPHOUS SI1-XCX, SI1-XGEX AND GE1-XCX [J].
ISHII, N ;
KUMEDA, M ;
SHIMIZU, T .
SOLID STATE COMMUNICATIONS, 1982, 41 (02) :143-146
[6]  
MOORE GE, 1949, NBS467 CIRC
[7]   ELECTRON-SPIN-RESONANCE AND IR STUDIES ON A-SI1-XGEX-H PREPARED BY GLOW-DISCHARGE DECOMPOSITION [J].
MORIMOTO, A ;
MIURA, T ;
KUMEDA, M ;
SHIMIZU, T .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1981, 20 (11) :L833-L836
[8]  
STUTZMANN M, 1982, THESIS MARBURG
[9]   INFLUENCE OF SPIN DEFECTS ON RECOMBINATION AND ELECTRONIC TRANSPORT IN AMORPHOUS-SILICON [J].
VOGETGROTE, U ;
KUMMERLE, W ;
FISCHER, R ;
STUKE, J .
PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1980, 41 (02) :127-140