STRUCTURAL CHARACTERIZATION OF THE SI(111)-CAF2 INTERFACE BY HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY

被引：15
|
作者：
TROMP, RM [1 ]
LEGOUES, FK [1 ]
KRAKOW, W [1 ]
SCHOWALTER, LJ [1 ]
机构：
[1] RENSSELAER POLYTECH INST,CTR INTEGRATED ELECTR,TROY,NY 12181
来源：
PHYSICAL REVIEW LETTERS | 1988年 / 61卷 / 19期
关键词：
D O I：
10.1103/PhysRevLett.61.2274
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：2274 / 2274
页数：1
相关论文
共 50 条
  • [1] STRUCTURAL CHARACTERIZATION OF THE SI(111)-CAF2 INTERFACE BY HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY - REPLY
    BATSTONE, JL
    PHILLIPS, JM
    PHYSICAL REVIEW LETTERS, 1988, 61 (19) : 2275 - 2275
  • [2] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF EPITAXIAL LAYERS AND INTERFACES IN THE CAF2/SI(100) AND CAF2/SI/CAF2/SI(100) HETEROSYSTEMS
    KISELEV, AN
    VELICHKO, AA
    OKOMELCHENKO, IA
    JOURNAL OF CRYSTAL GROWTH, 1993, 129 (1-2) : 163 - 172
  • [3] STRUCTURAL STUDY OF PTSI/(111)SI INTERFACE WITH HIGH-RESOLUTION ELECTRON-MICROSCOPY
    KAWARADA, H
    OHDOMARI, I
    HORIUCHI, S
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1984, 23 (10): : L799 - L802
  • [4] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF CAF2/SILICON INTERFACES
    PONCE, FA
    ANDERSON, GB
    OKEEFE, MA
    SCHOWALTER, LJ
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1986, 4 (04): : 1121 - 1122
  • [5] STRUCTURAL STUDY OF THE TISI2/SI(111) INTERFACE BY HIGH-RESOLUTION ELECTRON-MICROSCOPY
    CATANA, A
    HEINTZE, M
    SCHMID, PE
    STADELMANN, P
    EUREM 88, VOLS 1-3: TUTORIALS, INSTRUMENTATION AND TECHNIQUES / PHYSICS AND MATERIALS / BIOLOGY, 1988, 93 : 401 - 402
  • [6] STRUCTURAL STUDY OF THE TISI2/SI(111) INTERFACE BY HIGH-RESOLUTION ELECTRON-MICROSCOPY
    CATANA, A
    HEINTZE, M
    SCHMID, PE
    STADELMANN, P
    INSTITUTE OF PHYSICS CONFERENCE SERIES, 1988, (93): : 401 - 402
  • [7] HIGH-RESOLUTION ELECTRON-MICROSCOPY STUDY OF THE ERSI2/SI(111) INTERFACE
    DANTERROCHES, C
    PERRET, P
    DAVITAYA, FA
    CHROBOCZEK, JA
    THIN SOLID FILMS, 1990, 184 : 349 - 356
  • [8] INTERFACE PHONONS AT THE CAF2/SI(111) INTERFACE OBSERVED BY HIGH-RESOLUTION ELECTRON-ENERGY LOSS SPECTROSCOPY
    LIEHR, M
    THIRY, PA
    PIREAUX, JJ
    CAUDANO, R
    JOURNAL OF ELECTRONIC MATERIALS, 1986, 15 (05) : 305 - 305
  • [9] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF STRUCTURAL FEATURES AT THE SI/SIO2 INTERFACE
    CARIM, AH
    SINCLAIR, R
    MATERIALS LETTERS, 1987, 5 (03) : 94 - 98
  • [10] STRUCTURAL TRANSITIONS OF THE CAF2/SI(111) INTERFACE
    LUCAS, CA
    WONG, GCL
    LORETTO, D
    PHYSICAL REVIEW LETTERS, 1993, 70 (12) : 1826 - 1829
12345