共 50 条
- [22] INVESTIGATION OF PRIMARY DIFFRACTION PATTERNS USING A 3-CRYSTAL SPECTROMETER ARKIV FOR FYSIK, 1965, 30 (06): : 567 - &
- [25] ORIENTATION OF CRYSTALS USING A GEIGER COUNTER X-RAY SPECTROMETER JOURNAL OF SCIENTIFIC INSTRUMENTS, 1950, 27 (12): : 326 - 326
- [27] THE WAVELENGTH INFLUENCE ON THE FORMATION OF SPECTRA IN 3-CRYSTAL X-RAY-DIFFRACTOMETRY OF ALMOST PERFECT CRYSTALS KRISTALLOGRAFIYA, 1984, 29 (01): : 177 - 178
- [29] CURVED CRYSTAL ANALYSIS USING A TRIPLE-CRYSTAL X-RAY SPECTROMETER APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1990, 51 (05): : 369 - 373