STUDY OF FERROELECTRIC CRYSTALS USING X-RAY 3-CRYSTAL SPECTROMETER

被引:0
作者
NIKIFOROV, IY [1 ]
MALTSEV, YF [1 ]
BORODIN, VZ [1 ]
机构
[1] ROSTOV STATE UNIV, ROSTOV, USSR
来源
KRISTALLOGRAFIYA | 1973年 / 18卷 / 05期
关键词
D O I
暂无
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
引用
收藏
页码:1018 / 1022
页数:5
相关论文
共 50 条
[21]   X-RAY STUDY OF FERROELECTRIC LIQUID-CRYSTAL [J].
TERAUCHI, H ;
KOHIGASHI, T ;
MARUYAMA, N .
SOLID STATE COMMUNICATIONS, 1979, 31 (04) :241-243
[22]   3-CRYSTAL X-RAY SCAN SIMULATION OF SUPERLATTICE STRUCTURES USING ABELES TAKAGI DYNAMIC APPROACH [J].
SHRIVASTAVA, MC ;
SWAMINATHAN, S .
ELECTRONICS LETTERS, 1989, 25 (14) :933-934
[23]   INVESTIGATION OF PRIMARY DIFFRACTION PATTERNS USING A 3-CRYSTAL SPECTROMETER [J].
BROGREN, G ;
RAUNIO, G .
ARKIV FOR FYSIK, 1965, 30 (06) :567-&
[24]   ORIENTATION OF CRYSTALS USING A GEIGER COUNTER X-RAY SPECTROMETER [J].
JAMES, JA .
JOURNAL OF SCIENTIFIC INSTRUMENTS, 1950, 27 (12) :326-326
[25]   TWISTED CRYSTAL X-RAY SPECTROMETER [J].
FRAENKEL, BS .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1969, 40 (05) :732-&
[26]   A double crystal x-ray spectrometer [J].
Ross, PA .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1932, 3 (05) :253-260
[28]   THE WAVELENGTH INFLUENCE ON THE FORMATION OF SPECTRA IN 3-CRYSTAL X-RAY-DIFFRACTOMETRY OF ALMOST PERFECT CRYSTALS [J].
LOMOV, AA ;
KAZIMIROV, AY ;
ZAVYALOVA, AA .
KRISTALLOGRAFIYA, 1984, 29 (01) :177-178
[29]   CURVED CRYSTAL ANALYSIS USING A TRIPLE-CRYSTAL X-RAY SPECTROMETER [J].
HAKIM, MB ;
WOODGATE, BE .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1990, 51 (05) :369-373
[30]   SPHERICAL CRYSTAL COSMIC X-RAY SPECTROMETER [J].
SCHNOPPER, HW ;
KOCH, L ;
CANTIN, M ;
MOUGIN, B ;
ROCCHIA, R ;
BERTHELSDORF, RF ;
CULHANE, JL .
SPACE SCIENCE REVIEWS, 1981, 30 (1-4) :607-614