PATH SENSITIZATION, PARTIAL BOOLEAN DIFFERENCE, AND AUTOMATED FAULT DIAGNOSIS

被引：24
作者：
CHIANG, ACL
BANES, AV
REED, IS
机构：
来源：
IEEE TRANSACTIONS ON COMPUTERS | 1972年 / C 21卷 / 02期
关键词：
D O I：
10.1109/TC.1972.5008925
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：189 / +
页数：1
相关论文
共 7 条
[1]   ON FINDING A NEARLY MINIMAL SET OF FAULT DETECTION TESTS FOR COMBINATIONAL LOGIC NETS [J].
ARMSTRONG, DB .
IEEE TRANSACTIONS ON ELECTRONIC COMPUTERS, 1966, EC15 (01) :66-+
[2]   DIAGNOSIS OF SINGLE-GATE FAILURES IN COMBINATIONAL CIRCUITS [J].
HORNBUCKLE, GD ;
SPANN, RN .
IEEE TRANSACTIONS ON COMPUTERS, 1969, C 18 (03) :216-+
[3]   DERIVATION OF MINIMAL COMPLETE SETS OF TEST-INPUT SEQUENCES USING BOOLEAN DIFFERENCES [J].
MARINOS, PN .
IEEE TRANSACTIONS ON COMPUTERS, 1971, C 20 (01) :25-+
[4]   A CLASS OF MULTIPLE-ERROR-CORRECTING CODES AND THE DECODING SCHEME [J].
REED, IS .
IRE TRANSACTIONS ON INFORMATION THEORY, 1954, (04) :38-49
[5]  
ROTH JP, 1966, IBM J RES DEVELOP, V10
[6]  
SELLERS FF, 1967, SEP ANN IEEE COMP C
[7]  
YEN YT, 1969, SPR JOINT COMP C
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