BINDING-ENERGY REFERENCE IN X-RAY PHOTOELECTRON-SPECTROSCOPY OF INSULATORS

被引：89

作者：

LEWIS, RT ^{[1
]}

KELLY, MA ^{[1
]}

机构：

[1] SURFACE SCI LABS,PALO ALTO,CA 94303

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 1980年 / 20卷 / 1-2期

关键词：

D O I：

10.1016/0368-2048(80)85010-9

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：105 / 115

页数：11

共 18 条

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[5]

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EBEL, MF ;

EBEL, H .

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[7] IMPORTANCE OF PHOTOCONDUCTION IN ESCA EXPERIMENTS [J].

GONSKA, H ;

FREUND, HJ ;

HOHLNEICHER, G .

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[8] SURFACE ANALYSIS USING COMPLEMENTARY ELECTRONIC AND CHEMICAL MEASUREMENTS [J].

HAAS, GA .

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[9] DETERMINATION OF CHARGING EFFECT IN PHOTOELECTRON SPECTROSCOPY OF NONCONDUCTING SOLIDS [J].

HNATOWICH, DJ ;

HUDIS, J ;

PERLMAN, ML ;

RAGAINI, RC .

JOURNAL OF APPLIED PHYSICS, 1971, 42 (12) :4883-+

[10] WORK FUNCTION CHANGES DUE TO CHEMISORPTION OF WATER AND OXYGEN ON ALUMINUM [J].

HUBER, EE ;

KIRK, CT .

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