DEVICE UNDERSTANDING AND MODELING FOR DIAGNOSIS

被引：21
作者：
ABUHANNA, A
BENJAMINS, R
JANSWEIJER, W
机构：
来源：
IEEE EXPERT-INTELLIGENT SYSTEMS & THEIR APPLICATIONS | 1991年 / 6卷 / 02期
关键词：
D O I：
10.1109/64.79706
中图分类号：
TP18 [人工智能理论];
学科分类号：
081104 ; 0812 ; 0835 ; 1405 ;
摘要：
[No abstract available]
引用
收藏
页码：26 / 32
页数：7
相关论文
共 11 条
  • [1] Abu-Hanna A., 1990, Tenth International Workshop. Expert Systems and their Applications. General Conference. Second Generation Expert Systems, P97
  • [2] Abu-Hanna A., 1990, INT J EXPERT SYST, V3, P1, DOI [10.1177/002029407801100502, DOI 10.1177/002029407801100502]
  • [3] ABUHANNA A, 1989, P MODEL BASED DIAGNO, P162
  • [4] Brajnik G., 1990, Tenth International Workshop. Expert Systems and their Applications. General Conference. Second Generation Expert Systems, P53
  • [5] DIAGNOSTIC REASONING BASED ON STRUCTURE AND BEHAVIOR
    DAVIS, R
    [J]. ARTIFICIAL INTELLIGENCE, 1984, 24 (1-3) : 347 - 410
  • [6] DAVIS R, 1988, EXPLORING ARTIFICIAL, P297
  • [7] DIAGNOSING MULTIPLE FAULTS
    DEKLEER, J
    WILLIAMS, BC
    [J]. ARTIFICIAL INTELLIGENCE, 1987, 32 (01) : 97 - 130
  • [8] THE USE OF DESIGN DESCRIPTIONS IN AUTOMATED DIAGNOSIS
    GENESERETH, MR
    [J]. ARTIFICIAL INTELLIGENCE, 1984, 24 (1-3) : 411 - 436
  • [9] HAMSCHER W, 1988, MIT1074 AI LAB TECH
  • [10] STICKLEN J, 1989, P IJCAI WORKSHOP MOD, P165
12