SPIN-DEPENDENT LUMINESCENCE ENHANCED BY INTERFACE STRESS BETWEEN III-V ALLOY LAYERS ON EXCITATION OF CIRCULARLY POLARIZED-LIGHT

被引:10
作者
HORINAKA, H [1 ]
NAKANISHI, H [1 ]
SAIJYO, T [1 ]
INADA, H [1 ]
SONOMURA, H [1 ]
MIYAUCHI, T [1 ]
机构
[1] KINKI UNIV,FAC SCI & TECHNOL,HIGASHIOSAKA,OSAKA 577,JAPAN
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1988年 / 27卷 / 05期
关键词
D O I
10.1143/JJAP.27.765
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:765 / 770
页数:6
相关论文
共 20 条
  • [1] ASAI H, 1983, J APPL PHYS, V54, P2022
  • [2] BERT NA, 1982, SOV PHYS SEMICOND+, V16, P35
  • [3] OPTICAL ORIENTATION OF EXCITONS IN CDS
    BONNOT, A
    PLANEL, R
    BENOITAL.C
    [J]. PHYSICAL REVIEW B, 1974, 9 (02): : 690 - 702
  • [4] SPIN-POLARIZED PHOTO-ELECTRON EMISSION STUDY OF ALXGA1-XAS ALLOYS GROWN BY MOLECULAR-BEAM EPITAXY
    CICCACCI, F
    ALVARADO, SF
    VALERI, S
    [J]. JOURNAL OF APPLIED PHYSICS, 1982, 53 (06) : 4395 - 4398
  • [5] MODULATED PIEZOREFLECTANCE IN SEMICONDUCTORS
    GAVINI, A
    CARDONA, M
    [J]. PHYSICAL REVIEW B-SOLID STATE, 1970, 1 (02): : 672 - +
  • [6] MEASUREMENT OF G FACTOR OF CONDUCTION ELECTRONS BY OPTICAL DETECTION OF SPIN RESONANCE IN P-TYPE SEMICONDUCTORS
    HERMANN, C
    LAMPEL, G
    [J]. PHYSICAL REVIEW LETTERS, 1971, 27 (07) : 373 - &
  • [7] ELASTIC CONSTANTS OF SINGLE-CRYSTAL INDIUM PHOSPHIDE
    HICKERNELL, FS
    GAYTON, WR
    [J]. JOURNAL OF APPLIED PHYSICS, 1966, 37 (01) : 462 - +
  • [8] PHOTOLUMINESCENCE OF INGAP/GAAS (111) LPE LAYERS WITH ELASTIC STRAIN DUE TO LATTICE MISMATCH
    KATO, T
    MATSUMOTO, T
    ISHIDA, T
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1987, 26 (06): : 893 - 896
  • [10] CONSTRUCTION OF GAAS SPIN-POLARIZED ELECTRON SOURCE AND MEASUREMENTS OF ELECTRON POLARIZATION
    NAKANISHI, T
    DOHMAE, K
    FUKUI, S
    HAYASHI, Y
    HIROSE, I
    HORIKAWA, N
    IKOMA, T
    KAMIYA, Y
    KURASHINA, M
    OKUMI, S
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1986, 25 (05): : 766 - 767