USE OF TIME-DOMAIN TECHNIQUES FOR MICROWAVE TRANSISTOR S-PARAMETER MEASUREMENTS

被引：5
|
作者：
LOEB, HW
WARD, PJ
机构：
[1] CRANFIELD INST TECHNOL,CRANFIELD MK43 0AL,BEDFORDSHIRE,ENGLAND
[2] PLESSEY CO LTD,ALLEN CLARK RES CTR,TOWCESTER,NORTHAMPTONSHIR,ENGLAND
来源：
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1977年 / 26卷 / 04期
关键词：
D O I：
10.1109/TIM.1977.4314581
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：383 / 388
页数：6
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