USE OF TIME-DOMAIN TECHNIQUES FOR MICROWAVE TRANSISTOR S-PARAMETER MEASUREMENTS

被引：5

作者：

LOEB, HW

WARD, PJ

机构：

[1] CRANFIELD INST TECHNOL,CRANFIELD MK43 0AL,BEDFORDSHIRE,ENGLAND

[2] PLESSEY CO LTD,ALLEN CLARK RES CTR,TOWCESTER,NORTHAMPTONSHIR,ENGLAND

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1977年 / 26卷 / 04期

关键词：

D O I：

10.1109/TIM.1977.4314581

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：383 / 388

页数：6

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