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- [2] YIELD MODELING OF INTEGRATED-CIRCUITS SIEMENS FORSCHUNGS-UND ENTWICKLUNGSBERICHTE-SIEMENS RESEARCH AND DEVELOPMENT REPORTS, 1980, 9 (01): : 38 - 40
- [8] IMPACT OF MASK DEFECTS ON INTEGRATED-CIRCUITS YIELD PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1983, 394 : 186 - 192