RIM PHASE-SHIFT MASK COMBINED WITH OFF-AXIS ILLUMINATION - A PATH TO 0.5-LAMBDA NUMERICAL APERTURE GEOMETRIES

被引:4
作者
BRUNNER, TA
机构
关键词
MICROLITHOGRAPHY; OPTICAL LITHOGRAPHY; PHASE-SHIFT MASKS; OFF-AXIS ILLUMINATION; IMAGE FORMATION; SIMULATION;
D O I
10.1117/12.145956
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Phase-shift mask (PSM) approaches can be classified as either strong or weak. Weak PSM approaches, which are attractive because of their universal applicability to any pattern, are addressed. A simple design algorithm for rim PSM, called biased rim design (BiRD), is described. When used with normal stepper illumination (sigma=0.5), the modest benefits of rim PSMs are of questionable value in many cases. However, theoretical considerations show a synergy of weak PSM combined with off-axis illumination. One specific combination, termed BiRD/QUEST, is explored through a series of simulations. These results suggest that a properly biased weak PSM with appropriate illumination will allow robust manufacturing of 0.5lambda/NA lithographic patterns.
引用
收藏
页码:2337 / 2343
页数:7
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