A DIRECTED SEARCH METHOD FOR TEST-GENERATION USING A CONCURRENT SIMULATOR

被引：31
作者：
AGRAWAL, VD
CHENG, KT
AGRAWAL, P
机构：
来源：
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | 1989年 / 8卷 / 02期
关键词：
D O I：
10.1109/43.21831
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：131 / 138
页数：8
相关论文
共 19 条
[1]  
AGRAWAL VD, 1987, JUN P NATO ADV STUD
[2]  
BENDING MJ, 1984, IEEE DESIGN TEST, V1, P8
[3]  
Cheng K.-T., 1987, Proceedings of the 1987 IEEE International Conference on Computer Design: VLSI in Computers and Processors - ICCD '87 (Cat. No.87CH2473-7), P48
[4]   CONTROLLABILITY-OBSERVABILITY ANALYSIS OF DIGITAL CIRCUITS [J].
GOLDSTEIN, LH .
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS, 1979, 26 (09) :685-693
[5]   DESIGN LANGUAGE BASED APPROACH TO TEST SEQUENCE GENERATION [J].
HILL, FJ ;
HUEY, B .
COMPUTER, 1977, 10 (06) :28-33
[6]  
KJELKERUD E, 1979, JUN P DES AUT C SAN, P180
[7]  
KUBO H, 1968, NEC J RES DEV, V12, P69
[8]  
MA H, COMMUNICATION
[9]  
Mallela S., 1985, P INT TEST C, P57
[10]  
MARTLETT RA, 1978, JUN P DES AUT C LAS, P335
12