BIPOLAR TRANSISTOR SCREENING METHODS FOR NEUTRON HARDNESS ASSURANCE

被引：2
|
作者：
BLICE, RD [1 ]
MUNARIN, JA [1 ]
PEASE, RL [1 ]
机构：
[1] USN,AMMUNITION DEPOT,CRANE,IN 47522
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1972年 / NS19卷 / 06期
关键词：
D O I：
10.1109/TNS.1972.4326818
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：115 / 120
页数：6
相关论文
共 50 条
  • [41] HARDNESS ASSURANCE IN QUARTZ CRYSTAL RESONATORS
    FLANAGAN, TM
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1974, NS21 (06) : 390 - 392
  • [42] THE HARDNESS ASSURANCE WAFER PROBE HAWP
    KING, EE
    TETTEMER, GL
    LINDERMAN, PB
    MICHELETTI, PE
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1983, 30 (06) : 4345 - 4350
  • [43] Evaluation of proposed hardness assurance method for bipolar linear circuits with enhanced low dose rate sensitivity (ELDRS)
    Pease, RL
    Gehlhausen, M
    Krieg, J
    Titus, J
    Turflinger, T
    Emily, D
    Cohn, L
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1998, 45 (06) : 2665 - 2672
  • [44] RADIATION HARDNESS ASSURANCE OF SPACE ELECTRONICS
    ADAMS, L
    HOLMESSIEDLE, A
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1992, 314 (02): : 335 - 344
  • [45] IMPLEMENTING QML FOR RADIATION HARDNESS ASSURANCE
    WINOKUR, PS
    SEXTON, FW
    FLEETWOOD, DM
    TERRY, MD
    SHANEYFELT, MR
    DRESSENDORFER, PV
    SCHWANK, JR
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1990, 37 (06) : 1794 - 1805
  • [46] Geometric Optimization for Radiation Hardness Assurance
    Northum, Jeremy
    Guetersloh, Stephen
    2013 IEEE AEROSPACE CONFERENCE, 2013,
  • [47] HARDNESS ASSURANCE FOR SPACE SYSTEM MICROELECTRONICS
    PEASE, RL
    ALEXANDER, DR
    RADIATION PHYSICS AND CHEMISTRY, 1994, 43 (1-2): : 191 - 204
  • [48] MODULATING THE BIPOLAR JUNCTION TRANSISTOR SUBJECTED TO NEUTRON-IRRADIATION FOR INTEGRATED-CIRCUIT SIMULATION
    LIOU, JJ
    YUAN, JS
    SHAKOURI, H
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1992, 39 (03) : 593 - 597
  • [49] MEASUREMENT OF NEUTRON ENERGY-DEPENDENCE OF BASE CURRENT DEGRADATION OF A SILICON BIPOLAR-TRANSISTOR
    MCKENZIE, JM
    WITT, LJ
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1973, NS20 (06) : 341 - 348
  • [50] Correlation of a Bipolar-Transistor-Based Neutron Displacement Damage Sensor Methodology With Proton Irradiations
    Tonigan, Andrew M.
    Arutt, Charles N.
    Parma, Edward J.
    Griffin, Patrick J.
    Fleetwood, Daniel M.
    Schrimpf, Ronald D.
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2018, 65 (01) : 495 - 501
12345