Automated analysis of evolving interfaces during in situ electron microscopy

被引：16

作者：

Schneider, Nicholas M. ^{[1
]}

Park, Jeung Hun ^{[2
]}

Norton, Michael M. ^{[1
]}

Ross, Frances M. ^{[3
]}

Bau, Haim H. ^{[1
]}

机构：

[1] Univ Penn, Philadelphia, PA 19104 USA

[2] Univ Calif Los Angeles, Los Angeles, CA 90095 USA

[3] IBM Corp, TJ Watson Res Ctr, Yorktown Hts, NY 10598 USA

来源：

ADVANCED STRUCTURAL AND CHEMICAL IMAGING | 2016年 / 2卷

基金：

美国国家科学基金会;

关键词：

(10 max): In situ; Electron microscopy; Image analysis; Liquid cell electron microscopy; Interface tracking; Growth dynamics; Processes; Edge detection;

D O I：

10.1186/s40679-016-0016-z

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

In situ electron microscopy allows one to monitor dynamical processes at high spatial and temporal resolution. This produces large quantities of data, and hence automated image processing algorithms are needed to extract useful quantitative measures of the observed phenomena. In this work, we outline an image processing workflow for the analysis of evolving interfaces imaged during liquid cell electron microscopy. As examples, we show metal electro-deposition at electrode surfaces; beam-induced nanocrystal formation and dissolution; and beam-induced bubble nucleation, growth, and migration. These experiments are used to demonstrate a fully automated workflow for the extraction of, among other things, interface position, roughness, lateral wavelength, local normal velocity, and the projected area of the evolving phase as functions of time. The relevant algorithms have been implemented in Mathematica and are available online.

引用

页数：11

共 58 条

[31] Unified moving-boundary model with fluctuations for unstable diffusive growth [J].