FAULT TESTING AND DIAGNOSIS IN COMBINATIONAL DIGITAL CIRCUITS

被引：51

|

作者：

KAUTZ, WH

机构：

来源：

IEEE TRANSACTIONS ON COMPUTERS | 1968年 / C 17卷 / 04期

关键词：

D O I：

10.1109/TC.1968.229394

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

收藏

页码：352 / +

页数：1

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