FAULT TESTING AND DIAGNOSIS IN COMBINATIONAL DIGITAL CIRCUITS

被引：51
作者：
KAUTZ, WH
机构：
来源：
IEEE TRANSACTIONS ON COMPUTERS | 1968年 / C 17卷 / 04期
关键词：
D O I：
10.1109/TC.1968.229394
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：352 / +
页数：1
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共 18 条
[1]   ON FINDING A NEARLY MINIMAL SET OF FAULT DETECTION TESTS FOR COMBINATIONAL LOGIC NETS [J].
ARMSTRONG, DB .
IEEE TRANSACTIONS ON ELECTRONIC COMPUTERS, 1966, EC15 (01) :66-+
[2]   AN ALGORITHM FOR SELECTING AN OPTIMUM SET OF DIAGNOSTIC TESTS [J].
CHANG, HY .
IEEE TRANSACTIONS ON ELECTRONIC COMPUTERS, 1965, EC14 (05) :706-&
[3]  
Chegis I.A., 1958, T MAT I STEKLOV, V51, P270
[4]  
COBHAM A, 1961, S134 AIEE SPEC PUBL
[5]   TECHNIQUES FOR DIAGNOSIS OF SWITCHING CIRCUIT FAILURES [J].
GALEY, JM ;
ROTH, JP ;
NORBY, RE .
IEEE TRANSACTIONS ON COMMUNICATION AND ELECTRONICS, 1964, 83 (74) :509-&
[6]   MINIMUM-SCAN PATTERN-RECOGNITION [J].
GILL, A .
IRE TRANSACTIONS ON INFORMATION THEORY, 1959, 5 (02) :52-58
[7]   A REDUCTION TECHNIQUE FOR PRIME IMPLICANT TABLES [J].
GIMPEL, JF .
IEEE TRANSACTIONS ON ELECTRONIC COMPUTERS, 1965, EC14 (04) :535-+
[8]   REPRESENTATION OF SWITCHING CIRCUITS BY BINARY-DECISION PROGRAMS [J].
LEE, CY .
BELL SYSTEM TECHNICAL JOURNAL, 1959, 38 (04) :985-999
[9]  
MALING K, 1963, IEEE T ELECTRONIC CO, VEC12, P887
[10]   MINIMIZATION OF BOOLEAN FUNCTIONS [J].
MCCLUSKEY, EJ .
BELL SYSTEM TECHNICAL JOURNAL, 1956, 35 (06) :1417-1444
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