TRANSMISSION ELECTRON-MICROSCOPY OBSERVATIONS OF MISFIT DISLOCATIONS IN GAASP EPITAXIAL-FILMS

被引：26

作者：

AHEARN, JS ^{[1
]}

LAIRD, C ^{[1
]}

机构：

[1] UNIV PENN,DEPT MET & MAT SCI,PHILADELPHIA,PA 19104

来源：

JOURNAL OF MATERIALS SCIENCE | 1977年 / 12卷 / 04期

关键词：

D O I：

10.1007/BF00548160

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：699 / 707

页数：9

共 14 条

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[7] INTERPRETATION OF DISLOCATION CONTRAST IN X-RAY TOPOGRAPHS OF GAAS1-XPX [J].

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[8] DISLOCATIONS IN GAAS1-XPX [J].

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[10]

MATHEWS JW, 1976, THIN SOLID FILMS, V33, P253

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