HILLOCK-FREE INTEGRATED-CIRCUIT METALLIZATIONS BY AL-AL-O LAYERING

被引:24
作者
FAITH, TJ
机构
关键词
D O I
10.1063/1.329343
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:4630 / 4639
页数:10
相关论文
共 24 条
[1]   SUPERIOR ALUMINUM FOR INTERCONNECTIONS OF INTEGRATED CIRCUITS [J].
BHATT, HJ .
APPLIED PHYSICS LETTERS, 1971, 19 (02) :30-&
[2]   HILLOCK GROWTH IN THIN-FILMS [J].
CHAUDHAR.P .
JOURNAL OF APPLIED PHYSICS, 1974, 45 (10) :4339-4346
[3]   PLASMA-ETCHING - DISCUSSION OF MECHANISMS [J].
COBURN, JW ;
WINTERS, HF .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (02) :391-403
[4]  
DHEER RK, 1970, 1970 P IEEE EL COMP, P76
[5]  
DHEURLE F, 1968, T METALL SOC AIME, V242, P502
[6]   ALUMINUM FILMS DEPOSITED BY RF SPUTTERING [J].
DHEURLE, FM .
METALLURGICAL TRANSACTIONS, 1970, 1 (03) :725-&
[7]   MONOLAYER ADSORPTION OF OXYGEN ON ALUMINIUM [J].
DOREY, G .
SURFACE SCIENCE, 1971, 27 (02) :311-&
[8]  
DUSHMAN S, 1962, SCI F VACUUM TECHNIQ
[9]  
FAITH TJ, UNPUBLISHED
[10]  
HARTSOUGH LD, 7901 PERK ELM ULT DI