CHEMICAL-ANALYSIS OF SURFACES

[1] PHOTOELECTRON SPECTROMICROSCOPY [J]. NATURE, 1981, 290 (5807) : 556 - 561

[2] BRIGGS, 1983, PRACTICAL SURFACE AN

[3] CAZAUX J, 1984, ULTRAMICROSCOPY, V17, P43

[4] EXTENDED ENERGY-LOSS FINE-STRUCTURES (EELFS) - A NEW STRUCTURAL PROBE FOR SURFACES AND INTERFACES [J]. SURFACE SCIENCE, 1985, 162 (1-3) : 838 - 846

[5] QUANTITATIVE SURFACE-ANALYSIS USING ELECTRON SPECTROMETRY [J]. JOURNAL DE PHYSIQUE, 1984, 45 (NC-2): : 329 - 332

[6] IMAGING XPS - A NEW TECHNIQUE - PRINCIPLES [J]. SURFACE AND INTERFACE ANALYSIS, 1983, 5 (01) : 13 - 19

[7] KIRSCHNER J, 1983, SCANNING ELECTRON MI, V4, P1665

[8] LEGRESSUS C, 1979, J MICROSC SPECT ELEC, V4, P409

[9] PAPAZIAN HA, 1984, HIGH TEMP SCI, V18, P19

[10] PEACOCK DC, UNPUB SURF INTERFACE

[1] PHOTOELECTRON SPECTROMICROSCOPY [J]. NATURE, 1981, 290 (5807) : 556 - 561

[2] BRIGGS, 1983, PRACTICAL SURFACE AN

[3] CAZAUX J, 1984, ULTRAMICROSCOPY, V17, P43

[4] EXTENDED ENERGY-LOSS FINE-STRUCTURES (EELFS) - A NEW STRUCTURAL PROBE FOR SURFACES AND INTERFACES [J]. SURFACE SCIENCE, 1985, 162 (1-3) : 838 - 846

[5] QUANTITATIVE SURFACE-ANALYSIS USING ELECTRON SPECTROMETRY [J]. JOURNAL DE PHYSIQUE, 1984, 45 (NC-2): : 329 - 332

[6] IMAGING XPS - A NEW TECHNIQUE - PRINCIPLES [J]. SURFACE AND INTERFACE ANALYSIS, 1983, 5 (01) : 13 - 19

[7] KIRSCHNER J, 1983, SCANNING ELECTRON MI, V4, P1665

[8] LEGRESSUS C, 1979, J MICROSC SPECT ELEC, V4, P409

[9] PAPAZIAN HA, 1984, HIGH TEMP SCI, V18, P19

[10] PEACOCK DC, UNPUB SURF INTERFACE