PHONON EXCITATIONS IN LOW-ENERGY-ELECTRON SCATTERING FROM SOLID AR-FILMS, KR-FILMS, AND XE-FILMS - DIRECT OBSERVATION OF CONDUCTION-BAND DENSITY OF STATES

被引：40

作者：

MICHAUD, M

CLOUTIER, P

SANCHE, L

机构：

[1] Groupe du Conseil de Recherches Médicales du Canada en Sciences des Radiations, Faculté de Médecine, Université de Sherbrooke, Sherbrooke

来源：

PHYSICAL REVIEW B | 1991年 / 44卷 / 19期

关键词：

D O I：

10.1103/PhysRevB.44.10485

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

High-resolution low-energy-electron scattering (1-14 eV) from multilayer solid films of Ar, Kr, and Xe is reported for various energy losses and angles of incidence. We show that the scattered-electron intensity arising from multiple scattering on phonons, measured as a function of the incident energy, reproduces the conduction-band density of states calculated recently for rare-gas solids by Bacalis et al. Using a simple multiple-scattering analysis we conclude that, under appropriate experimental conditions, this results from probing the inverse total mean free path of an electron propagating into the bulk of a film.

引用

页码：10485 / 10492

页数：8

共 27 条

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