SCANNING PROBE MICROSCOPY OF THIN-FILMS

被引：46

作者：

HUES, SM ^{[1
]}

COLTON, RJ ^{[1
]}

MEYER, E ^{[1
]}

GUNTHERODT, HJ ^{[1
]}

机构：

[1] INST PHYS BASEL,BASEL,SWITZERLAND

来源：

关键词：

D O I：

10.1557/S088376940004344X

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

[No abstract available]

引用

页码：41 / 49

页数：9

共 85 条

[51] ATOMIC RESOLUTION ON LIF (001) BY ATOMIC FORCE MICROSCOPY
MEYER, E
HEINZELMANN, H
RUDIN, H
GUNTHERODT, HJ
[J]. ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER, 1990, 79 (01): : 3 - 4
[52] ATOMIC RESOLUTION ON THE AGBR(001) SURFACE BY ATOMIC FORCE MICROSCOPY
MEYER, E
GUNTHERODT, HJ
HAEFKE, H
GERTH, G
KROHN, M
[J]. EUROPHYSICS LETTERS, 1991, 15 (03): : 319 - 323
[53] Meyer E., 1992, SCANNING TUNNELING M
[54] MEYER E, 1992, FUNDAMENTALS FRICTIO
[55] MEYER E, IN PRESS THIN SOLID
[56] MEYER E, 1988, J MICROSC, V151, P269
[57] MEYER E, 1992, IN PRESS PHYS REV LE
[58] MEYER E, 1992, GLASTECHNISCHE BERIC
[59] MEYER E, 1992, PROGR SURFACE SCI
[60] OPTICAL-BEAM-DEFLECTION ATOMIC FORCE MICROSCOPY - THE NACL (001) SURFACE
MEYER, G
AMER, NM
[J]. APPLIED PHYSICS LETTERS, 1990, 56 (21) : 2100 - 2101