SCANNING PROBE MICROSCOPY OF THIN-FILMS

被引:46
作者
HUES, SM [1 ]
COLTON, RJ [1 ]
MEYER, E [1 ]
GUNTHERODT, HJ [1 ]
机构
[1] INST PHYS BASEL,BASEL,SWITZERLAND
关键词
D O I
10.1557/S088376940004344X
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
[No abstract available]
引用
收藏
页码:41 / 49
页数:9
相关论文
共 85 条
[1]   FREQUENCY-MODULATION DETECTION USING HIGH-Q CANTILEVERS FOR ENHANCED FORCE MICROSCOPE SENSITIVITY [J].
ALBRECHT, TR ;
GRUTTER, P ;
HORNE, D ;
RUGAR, D .
JOURNAL OF APPLIED PHYSICS, 1991, 69 (02) :668-673
[2]   COMPACT, COMBINED SCANNING TUNNELING FORCE MICROSCOPE [J].
ANSELMETTI, D ;
GERBER, C ;
MICHEL, B ;
GUNTHERODT, HJ ;
ROHRER, H .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1992, 63 (05) :3003-3006
[3]   PIEZOELECTRIC CERAMIC DISPLACEMENT CHARACTERISTICS AT LOW-FREQUENCIES AND THEIR CONSEQUENCES IN FABRY-PEROT INTERFEROMETRY [J].
BASEDOW, RW ;
COCKS, TD .
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1980, 13 (08) :840-844
[4]  
BERNDT R, 1990, SCANNING TUNNELING M
[5]   ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
QUATE, CF ;
GERBER, C .
PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933
[6]  
BLUNIER S, 1992, IN PRESS PHYS REV LE
[7]   LANGMUIR-BLODGETT-FILMS - FROM MICRON TO ANGSTROM [J].
BOURDIEU, L ;
SILBERZAN, P ;
CHATENAY, D .
PHYSICAL REVIEW LETTERS, 1991, 67 (15) :2029-2032
[8]  
BRIGGS GAD, 1988, P IEEE ULTRASON S, P743
[9]  
Brooks C. A., 1979, PROPERTIES DIAMOND
[10]   SURFACE FORCE MEASUREMENTS ON PICOMETER AND PICONEWTON SCALES [J].
BRYANT, PJ ;
KIM, HS ;
DEEKEN, RH ;
CHENG, YC .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (04) :3502-3505