AN IMPROVED DEVICE FOR X-RAY DIFFRACTION STUDIES AT LOW TEMPERATURES

被引：86
作者：
POST, B
SCHWARTZ, RS
FANKUCHEN, I
机构：
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1951年 / 22卷 / 03期
关键词：
D O I：
10.1063/1.1745893
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：218 / 219
页数：2
相关论文
共 3 条
[1]   FURTHER TECHNIQUES IN SINGLE-CRYSTAL X-RAY DIFFRACTION STUDIES AT LOW TEMPERATURES [J].
ABRAHAMS, SC ;
COLLIN, RL ;
LIPSCOMB, WN ;
REED, TB .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1950, 21 (04) :396-397
[2]   A LOW TEMPERATURE SINGLE CRYSTAL X-RAY DIFFRACTION TECHNIQUE [J].
KAUFMAN, HS ;
FANKUCHEN, I .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1949, 20 (10) :733-734
[3]   POLARIZING ATTACHMENT FOR THE MICROSCOPE OF A SINGLE CRYSTAL X-RAY GONIOMETER [J].
PERUTZ, MF .
JOURNAL OF SCIENTIFIC INSTRUMENTS AND OF PHYSICS IN INDUSTRY, 1949, 26 (04) :127-128
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