MEASUREMENT AND MODELING OF COMPUTER RELIABILITY AS AFFECTED BY SYSTEM ACTIVITY

被引：81

作者：

IYER, RK

ROSSETTI, DJ

HSUEH, MC

机构：

[1] UNIV ILLINOIS,DEPT ELECT & COMP ENGN,URBANA,IL 61801

[2] UNIV ILLINOIS,DEPT COMP SCI,URBANA,IL 61801

[3] STANFORD UNIV,DEPT ELECT ENGN,COMP SYST LAB,CTR RELIABLE COMP,STANFORD,CA 94305

[4] STANFORD UNIV,DEPT COMP SCI,COMP SYST LAB,CTR RELIABLE COMP,STANFORD,CA 94305

来源：

ACM TRANSACTIONS ON COMPUTER SYSTEMS | 1986年 / 4卷 / 03期

关键词：

D O I：

10.1145/6420.6422

中图分类号：

TP301 [理论、方法];

学科分类号：

081202 ;

摘要：

引用

页码：214 / 237

页数：24

共 22 条

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[2]

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[3]

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[4]

BLACKBURN DL, 1974, JUN IEEE PESC C REC, P140

[5]

BUTNER SE, 1980, 10TH INT S FAULT TOL

[6]

CASTILLO X, 1982, 12TH INT S FAULT TOL

[7]

CASTILLO X, 1981, 11TH P INT S FAULT T, P84

[8]

Feller W., 1968, INTRO PROBABILITY TH, V3rd

[9]

Gunther N. L., 1980, 10th International Symposium on Fault-Tolerant Computing, P213

[10]

IVALO VES, 1962, ELECTRON APPL, V22, P148