OPTICAL-DETECTION OF MAGNETIC-RESONANCE FOR A DEEP-LEVEL DEFECT IN SILICON

被引：59

作者：

LEE, KM

ODONNELL, KP

WEBER, J

CAVENETT, BC

WATKINS, GD

机构：

来源：

PHYSICAL REVIEW LETTERS | 1982年 / 48卷 / 01期

关键词：

D O I：

10.1103/PhysRevLett.48.37

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：37 / 40

页数：4

共 16 条

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