EFFECT OF SURFACE CONTAMINATION ON FINE-STRUCTURE OF ANGULAR CHARACTERISTICS OF SECONDARY-ELECTRON EMISSION FROM SINGLE-CRYSTALS

被引：0

作者：

KORABLEV, VV

机构：

来源：

FIZIKA TVERDOGO TELA | 1972年 / 14卷 / 06期

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D O I：

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中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：1789 / +

页数：1

共 15 条

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LAPONSKY, AB
WHETTEN, NR
[J]. PHYSICAL REVIEW, 1960, 120 (03): : 801 - 806
[4] Shul'man A. R., 1970, Fizika Tverdogo Tela, V12, P758
[5] Shul'man A. R., 1970, Fizika Tverdogo Tela, V12, P1866
[6] SHULMAN AR, 1969, IZV AN SSSR FIZ+, V33, P475
[7] SHULMAN AR, 1968, FIZ TVERD TELA, V10, P1913
[8] FINE STRUCTURE OF SECONDARY EMISSION VS ANGLE OF INCIDENCE OF PRIMARY BEAM ON TITANIUM SINGLE CRYSTALS
SOSHEA, RW
DEKKER, AJ
[J]. PHYSICAL REVIEW, 1961, 121 (05): : 1362 - &
[9] STEN RM, 1964, APPL PHYS LETT, V5, P218
[10] ORIGIN OF ANGULAR DEPENDENCE OF SECONDARY EMISSION OF ELECTRONS FROM TUNGSTEN
STERN, RM
TAUB, H
[J]. PHYSICAL REVIEW LETTERS, 1968, 20 (24) : 1340 - &