HYDROGEN AND DEUTERIUM ION-BOMBARDMENT EFFECTS IN SIO2-FILMS

被引：4

作者：

BELSON, J

WILSON, IH

机构：

[1] Department of Electronic and Electrical Engineering, University of Surrey, Guildford

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1979年 / 26卷 / 06期

关键词：

D O I：

10.1109/TNS.1979.4330234

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

[No abstract available]

引用

收藏

页码：4819 / 4823

页数：5

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