QUANTITATIVE X-RAY-DIFFRACTION ANALYSIS OF TEXTURED SHEET METALS

被引：3

作者：

KAMPFE, B

PATZELT, P

NESTLER, CG

机构：

[1] Techn. Hochschule Karl-Marx-Stadt, Sektion Chemie Und Werkstofftechnik, Karl-Marx-Stadt

来源：

KRISTALL UND TECHNIK-CRYSTAL RESEARCH AND TECHNOLOGY | 1979年 / 14卷 / 02期

关键词：

D O I：

10.1002/crat.19790140209

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

A disadvantage of the quantitative X‐ray diffraction analysis of samples from sheet metals is the incorrectness of the measuring results owing to the presence of textures in the material. In considering several reflexes of every phase the influence of textures may be reduced. Such a method will be presented and tested. The yielded results show that the new method can be useful for textured sheet metal samples. Copyright © 1979 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim

引用

页码：187 / 195

页数：9

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