FIELD ELECTRON CURRENT NOISE OF METAL-FILM EMITTERS

被引：2

作者：

SUVOROV, AL

SHESHIN, EP

DOLIN, DE

KUZYAKHMETOV, GG

机构：

[1] Institute of Theoretical and Experimental Physics, Moscow, 117259

来源：

APPLIED SURFACE SCIENCE | 1994年 / 76卷 / 1-4期

关键词：

D O I：

10.1016/0169-4332(94)90318-2

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The fluctuation character of the field electron current in uranium-indium (U-In), tungsten-rhenium (W-Re) and niobium-germanium (Nb-Ge) film systems, was studied. In all cases, psi(s) (substrate-material work function) was less than psi(f) (film-material work function) and the coverage degree theta was in the range 1-10. Amplitude spectra of the fluctuations were obtained and analyzed. The shape and parameters of individual fluctuations resulting from low-energy gas ion bombardment, occurring in the space between the field emitter and the anode by the electron shock mechanism, were also obtained. It is shown that these spectra qualitatively reflect the film system degradation and make it possible to evaluate its lifetime.

引用

页码：26 / 30

页数：5

共 14 条

[1] FIELD-EMISSION STUDY OF GERMANIUM THIN-FILMS ON A NIOBIUM SURFACE [J].