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TE DOPING STUDY IN MOLECULAR-BEAM EPITAXIAL-GROWTH OF GASB USING SB2TE3
被引:27
作者:
CHIU, TH
[1
]
DITZENBERGER, JA
[1
]
LUFTMAN, HS
[1
]
TSANG, WT
[1
]
HA, NT
[1
]
机构:
[1] AT&T BELL LABS,MURRAY HILL,NJ 07974
关键词:
D O I:
10.1063/1.103118
中图分类号:
O59 [应用物理学];
学科分类号:
摘要:
Te evaporated from a Sb2Te3 compound source has been used to dope GaSb grown by molecular beam epitaxy. Te concentrations up to 2×1019 cm-3 followed a simple Arrhenius behavior with respect to source temperature. Efficient incorporation of Te remained insensitive to growth temperature until above 540 °C. Carrier density was found very close to Te doping level up to about 2×1018 cm -3. Above that, electron mobility as well as crystallinity deteriorated with increasing Te concentration. A dependence of surface reconstruction on Te doping level was observed. A complete change from (1×3) to (2×1) pattern occurred when Te concentration considerably exceeded its solubility limit in GaSb.
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页码:1688 / 1690
页数:3
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