SECONDARY ION MASS-SPECTROMETRY AND ITS RELATION TO HIGH-ENERGY ION-BEAM ANALYSIS TECHNIQUES

被引：27
作者：
MAGEE, CW
机构：
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1981年 / 191卷 / 1-3期
关键词：
D O I：
10.1016/0029-554X(81)91019-3
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：297 / 307
页数：11
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