SURFACE CORE-LEVEL PHOTOELECTRON DIFFRACTION FROM SI DIMERS AT THE SI(001)-(2X1) SURFACE

被引：98
作者：
BULLOCK, EL
GUNNELLA, R
PATTHEY, L
ABUKAWA, T
KONO, S
NATOLI, CR
JOHANSSON, LSO
机构：
[1] UNIV CAMERINO,DIPARTIMENTO FIS,I-62032 CAMERINO,ITALY
[2] TOHOKU UNIV,SCI MEASUREMENTS RES INST,SENDAI,MIYAGI 980,JAPAN
[3] IST NAZL FIS NUCL,NAZL FRASCATI LAB,I-00044 FRASCATI,ITALY
[4] LUND UNIV,INST PHYS,DEPT SYNCHROTRON RADIAT RES,S-22362 LUND,SWEDEN
来源：
PHYSICAL REVIEW LETTERS | 1995年 / 74卷 / 14期
关键词：
D O I：
10.1103/PhysRevLett.74.2756
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
Intensity variations of the dimer derived surface shifted Si 2p core level from single domain Si(001)- (2×1) have been measured as a function of azimuthal angle. Comparisons to multiple scattering calculations show that such measurements provide a method for determining the structural origins of surface shifted core levels. In addition, a structural analysis illustrates the sensitivity of this method to the detailed structure around the emitting atoms. In this case, a determination of the surface geometry indicates that the dimer bond is tilted 19.0°with respect to the surface. © 1995 The American Physical Society.
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页码：2756 / 2759
页数：4
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